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Title: Nanoparticles In The Scanning Transmission Electron Microscope
Authors: Zacher, Sara
Issue Date: 13-Oct-2009
Abstract: The process of improving and producing novel nanomaterials requires visibility at the nanoscale -- something the scanning transmission electron microscopes (STEM), especially the new, aberration-corrected STEM, can provide. This thesis focuses on ways to improve our use of STEM on nanoparticles by understanding damage of quantum particles (QPs), and how annular dark field (ADF) can be used to measure QP shape and provide proofs for oriented attachment growth in quantum rods using both low- and high-resolution ADF imaging. Also, in an attempt to increase our understanding of the differences between simulation and experimental images and how the probe behaves inside of the sample, simulated STEM ADF images of amorphous layers and small tilts in crystalline specimens were studied and experimentally measured and simulated convergent beam electron diffraction pattern intensities were closely matched by including inelastic scattering in the form of bulk plasmon scattering into simulation
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