Reliability Study Of Flash Memory And Its Applications
| dc.contributor.author | Wu, Shuo | en_US |
| dc.contributor.chair | Kan, Edwin Chihchuan | en_US |
| dc.contributor.committeeMember | Suh, Gookwon Edward | en_US |
| dc.date.accessioned | 2012-06-28T20:57:37Z | |
| dc.date.available | 2016-12-30T06:46:57Z | |
| dc.date.issued | 2011-08-31 | en_US |
| dc.identifier.other | bibid: 7745419 | |
| dc.identifier.uri | https://hdl.handle.net/1813/29496 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Reliability | en_US |
| dc.subject | Flash Memory | en_US |
| dc.subject | Random Number Generator | en_US |
| dc.title | Reliability Study Of Flash Memory And Its Applications | en_US |
| dc.type | dissertation or thesis | en_US |
| thesis.degree.discipline | Electrical Engineering | |
| thesis.degree.grantor | Cornell University | en_US |
| thesis.degree.level | Master of Science | |
| thesis.degree.name | M.S., Electrical Engineering |
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